SHENG Zhou. Exploration of Application of Reliability Standard YY/T 1837—2022 in Development of Active Implantable Medical Devices[J]. Chinese Journal of Medical Instrumentation, 2024, 48(2): 221-227. DOI: 10.12455/j.issn.1671-7104.230450
      Citation: SHENG Zhou. Exploration of Application of Reliability Standard YY/T 1837—2022 in Development of Active Implantable Medical Devices[J]. Chinese Journal of Medical Instrumentation, 2024, 48(2): 221-227. DOI: 10.12455/j.issn.1671-7104.230450

      Exploration of Application of Reliability Standard YY/T 1837—2022 in Development of Active Implantable Medical Devices

      • In the field of medical devices, there has been a long-term lack of a general technical requirements framework for reliability that can be applied in the development of high-risk active implantable medical devices. This study combines the requirements of YY/T 1837—2022 to comprehensively explain and explore the requirements for reliability work that can be performed at each stage of development of active implantable medical device products, and provides a reference for product reliability work in the industry.
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