磁共振超SAR问题及应对方法

      The SAR Problem and Trouble Shooting Strategy

      • 摘要: 磁共振扫描时SAR超标,需要对层数、激发翻转角、SAR mode及TR时间等进行修改,这些将直接影响扫描范围、时间、图像质量。该研究从SAR的基本定义出发,分析影响SAR的因素,结合西门子经典磁共振(1.5 T AVANTO和3.0 T VERIO)原理图,从使用和故障角度分析SAR超标现象,说明此类问题故障诊断的方法。

         

        Abstract: The modifications of slices, flip angle, SAR mode and TR time are required when the SAR exceeds the limits. The scan time and image quality are affected by those. This study analyzes the SAR from the basic side. With the principle diagram of SIEMENS 1.5 T AVANTO and 3.0 T VERIO MRIS, the trouble shooting procedure of SAR problem is reached both in application and problem sides.

         

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